The furnace was
then switched off and cooled down to room temperature. buy LY2874455 Figure 1 Controlled growth of quasi-1D ZnO nanowires. (a) Schematic diagram of experimental apparatus for growth of ZnO nanowires and (b) schematic illustration of growth mechanism for fabricating ZnO nanowire arrays. The morphologies and crystal structures of the resulting ZnO materials were characterized using field-emission scanning electron microscope (SEM) (Hitachi S-4300, RAD001 ic50 Hitachi Co., Tokyo, Japan) and X-ray diffractometer (XRD) (BEDE Scientific Inc., Centennial, CO, USA). The optical property was studied by photoluminescence (PL) measurement (Jobin Yvon Triax320, Horiba Ltd., Minami-ku, Kyoto, Japan). The 325-nm line of a He-Cd laser was used as an excitation light source for the PL measurement. Results and discussions Figure 2a
shows a typical SEM image of a PS nanosphere self-assembled monolayer on the substrate, indicating that a defectless region can be achieved. The ordering is reasonably good although point defects and stacking faults are observed in some areas, which may be produced by a variation in sphere size or process fluctuation. A closer examination presented in insert of Figure 2a STA-9090 shows perfectly ordered arrays. The self-assembled arrays of PS spheres were then used to guide ZnO growth onto substrate. For this purpose, sol–gel-derived ZnO thin films were spin-coated onto the self-assembled monolayer structure. According to previous studies, the annealing temperature of 750°C was chosen
to be the post-thermal treatment parameter . Due to the high liquidity Farnesyltransferase of ZnO precursor, this technique produces a honeycomb-like hexagonal ZnO pattern, as shown in Figure 2b. It is clear that the honeycomb-like arrangement of the sol–gel-derived ZnO pattern was preserved during the growth process. Figure 2c presents a tilted SEM image of the obtained quasi-1D ZnO nanowire arrays. Figure 2 SEM images. Schematic illustration of the strategy for fabricating patterned quasi-1D ZnO nanowire arrays. Bottom of (a) shows low-magnification SEM image of the self-assembled monolayer polystyrene spheres. Inset is the high-magnification SEM image. Bottom of (b) reveals top-view SEM image of sol–gel-derived ZnO thin film patterned by periodic nanospheres. Bottom of (c) shows tilt-view SEM image of quasi-1D ZnO nanowire arrays grown on ZnO buffer layer, where the hexagonal pattern is apparent. Figure 3 curve a shows the XRD pattern of sol–gel-derived ZnO thin films annealed at the temperatures of 750°C. The typical thickness of ZnO films is 200 nm, which was determined from the cross-sectional SEM images. The XRD spectra reveal that the ZnO films developed without the existence of secondary phases and clusters, and only the ZnO (002) diffraction plane is observed. The c-axis orientation in ZnO films might be due to a self-texturing mechanism as discussed by Jiang et al..